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Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni)

Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni)

Shlimas, D.I.; Kozlovskiy, A.L.; Kaliekperov, M.E.; Kadyrzhanov, K.K.; Uglov, V.V.
URI: http://rep.enu.kz/handle/enu/21172
Date: 2020

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