Evaluation of threshold conditions for latent track formation in nanocrystalline Y2Ti2O7

dc.contributor.author	Ibrayeva, A.
dc.contributor.author	Mutali, A.
dc.contributor.author	O’Connell, J.
dc.contributor.author	Sohatsky, A.
dc.contributor.author	Skuratov, V.
dc.contributor.author	Alekseeva, L.
dc.contributor.author	Korneeva, E.
dc.contributor.author	Rymzhanov, R.
dc.date.accessioned	2025-01-20T11:37:56Z
dc.date.available	2025-01-20T11:37:56Z
dc.date.issued	2022
dc.identifier.issn	2522-9869
dc.identifier.other	DOI: 10.32523/ejpfm.2022060204
dc.identifier.uri	http://rep.enu.kz/handle/enu/20900
dc.description.abstract	We present the first report on the structural effects induced by swift xenon ions in nanocrystalline pyrochlore Y2Ti2O7 (outside the metal matrix) studied using high resolution transmission electron microscopy. Latent amorphous tracks were observed in the range of electronic stopping powers 4.8–23.2 keV/nm. Obtained results enabled estimation of the threshold energy loss values for formation of continuous and not continuous (surface) tracks at ≈ 8 keV/nm and 3.5 keV/nm, respectively.	ru
dc.language.iso	en	ru
dc.publisher	Eurasian Journal of Physics and Functional Materials	ru
dc.relation.ispartofseries	6(2), 124-131;
dc.subject	nanocrystalline materials	ru
dc.subject	Y2Ti2O7 pyrochlore	ru
dc.subject	swift heavy ions	ru
dc.subject	latent tracks	ru
dc.subject	transmission electron microscopy (TEM)	ru
dc.title	Evaluation of threshold conditions for latent track formation in nanocrystalline Y2Ti2O7	ru
dc.type	Article	ru