dc.contributor.author | Callaghan, Peter J. | |
dc.contributor.author | Caffrey, David | |
dc.contributor.author | Zhussupbekov, Kuanysh | |
dc.contributor.author | Berman, Samuel | |
dc.contributor.author | Zhussupbekova, Ainur | |
dc.contributor.author | Smith, Christopher M. | |
dc.contributor.author | Shvets, Igor V. | |
dc.date.accessioned | 2024-09-18T04:55:46Z | |
dc.date.available | 2024-09-18T04:55:46Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 2470-1343 | |
dc.identifier.other | doi.org/10.1021/acsomega.3c09958 | |
dc.identifier.uri | http://rep.enu.kz/handle/enu/16552 | |
dc.description.abstract | Amorphous transparent conducting oxides (aTCOs) have seen substantial interest in recent years due to the significant benefits that they can bring to transparent electronic devices. One such material of promise is amorphous ZnxSn1−xOy (a-ZTO). a-ZTO possesses many attractive properties for a TCO such as high transparency in the visible range, tunable charge carrier concentration, electron mobility, and only being composed of common and abundant elements. In this work, we employ a combination of UV−vis spectrophotometry, X-ray photoemission spectroscopy, and in situ scanning tunneling spectroscopy to investigate a 0.33 eV blue shift in the optical bandgap of a-ZTO, which we conclude to be due to quantum confinement effects. | ru |
dc.language.iso | en | ru |
dc.publisher | ACS Omega | ru |
dc.relation.ispartofseries | Vol 9;Issue 6 | |
dc.title | Variation in the Bandgap of Amorphous Zinc Tin Oxide: Investigating the Thickness Dependence via In Situ STS | ru |
dc.type | Article | ru |